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Unicon invites you to participate in the 17th LASER World of Photonics China in Shanghai

2025-09-02 15:23:22 admin

The 17th Laser World of Photonics China Shanghai will be grandly held in Halls 6.1H 7.1H and 8.1H of the National Exhibition and Convention Center (Shanghai) from July 11th to 13th 2023. The exhibition area of this event will reach 80,000 square meters and it is expected to attract over 1,100 well-known enterprises in the global optoelectronics industry settle in More than 80,000 domestic and overseas visitors came to the scene for viewing and negotiation.

Uniconon will also bring a variety of devices to this grand event. There will also be special activities on site with exquisite small gifts given away. We sincerely welcome you to visit.

Exhibition Time

July 11th - July 13th, 2023

Exhibition Venue

National Exhibition and Convention Center (Shanghai)

Booth: 7.1E244

Free and fast registration entrance on the official website Click to enter

There will be mysterious activities on the booth site

Looking forward to your participation

Exhibition equipment


F50 Film thickness Measuring instrument
The F50 can be straightened very simplyThickness distribution map of the sample film with a diameter of 450 millimeters. By using the r-θ polar coordinate moving platform, the required test points can be quickly located and the test thickness can be obtained in real time, approximately two points per second.
Related applicationsSemiconductor manufacturing (photoresist, oxides/nitrides /SOI, wafer backside grinding); LCD liquid crystal display (polyimide, ITO transparent conductive film); Optical coating (hard coating, anti-reflection layer); MEMS micro-electromechanical systems (photoresist, silicon-based film layers).


P7 Step gauge
The P-7 can perform 2D and 3D measurements of step height, roughness, warpage and stress, and its scanning can reach 150mm without image stitching.
Related applicationsFilm/thick film steps Etching depth measurement Photoresist/photoresist step Flexible film Characterization of surface roughness/flatness; Surface curvature and contour analysis; 2D stress measurement of thin films Surface structure analysis 3D contour imaging of the surface Defect characterization and defect analysis.


R50 Four-probe Resistivity meter
The Filmetrics R50 series offers contact four-point probe (4PP) and non-contact eddy current (EC) measurements. A speed of 1 point per second maps the resistivity/conductivity of the conductive film. The electric X-Y stage uses standard wafer suction cups to customize sample racks, capable of measuring samples up to 300mm or areas up to 200mm.
Related applicationsSilicon wafer doping Metal layer thickness test Wafer resistivity test


Profilm3D White Light Interference Optical Profilometer
Profilm3D employs advanced vertical interference scanning (WLI) and high-precision phase interference (PSI) technologies. Achieve sub-nanometer surface morphology research with strong cost performance.
Related applicationsRoughness measurement Three-dimensional topography characterization Measurement of step height


FS-1 multi-wavelength ellipsometer
The Film Sense FS-1 multi-wavelength ellipsometer adopts a long-life LED light source and a non-moving component ellipsometer detector, enabling reliable film measurement in a compact ellipsometer with simple operation.
Related applicationsSilicon dioxide and nitrides, high dielectric and low dielectric materials, amorphous and polycrystalline materials, silicon films, photoresists. High and low index films, such as SiO2, TiO2, Ta2O5, MgF2. TCO (such as ITO), amorphous silicon thin films, organic thin films (OLED technology), etc