CHInano, as the largest exhibition in the field of nanotechnology in China, has gathered a group of exhibitors in the field of precision detection, and the on-site business cooperation atmosphere is high. This year's Precision Inspection Zone will continue to gather top precision inspection platforms and professional equipment industry giants from home and abroad. We sincerely invite you to visit and witness the birth and development of future technology together!
Unicon participated in the Suzhou Nano Expo with two key products. Among them, the Filmetrics F50 automatic Mapping Film thickness measuring instrument from KLA can automatically and quickly obtain the thickness distribution map of the film, while the Film Sense multi-wavelength ellipsometer has an extremely strong ability to measure nano-scale films.
Unicon booth No. 533, Hall B1There will be a variety of surprise raffle activities on site. We look forward to seeing you all at CHInano 2025!
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Exhibition Time: October 22-24, 2025
Exhibition Venue: Suzhou International Expo Center
Unicon boothNo. 533, Hall B1
(There are illustrated locations below for guidance.)
Exhibition Hall distribution
Booth Guidance
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Filmetrics F50 Automatic Mapping Film Thickness Measuring Instrument | ||
The F50 can very simply obtain the thickness distribution map of sample films with a maximum diameter of 450 millimeters. By using the r-θ polar coordinate moving platform, the required test points can be quickly located and the test thickness can be obtained in real time, approximately two points per second. | ||
Related applicationsSemiconductor manufacturing (photoresist, oxides/nitrides /SOI, wafer backside grinding); LCD liquid crystal display (polyimide, ITO transparent conductive film); Optical coating (hard coating, anti-reflection layer); MEMS micro-electromechanical systems (photoresist, silicon-based film layers). |
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FS-8 multi-wavelength ellipsometer | ||
The Film Sense FS-8 multi-wavelength ellipsometer adopts a long-life LED light source and a non-moving component ellipsometer detector, enabling reliable film measurement in a compact ellipsometer with simple operation. | ||
Related applicationsSilicon dioxide and nitrides, high dielectric and low dielectric materials, amorphous and polycrystalline materials, silicon films, photoresists. High and low index films, such as SiO2, TiO2, Ta2O5, MgF2. TCO (such as ITO), amorphous silicon films, organic films (OLED technology), etc. |
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