Filmetrics F10-RT Thin Film thickness Measuring instrument
Filmetrics F10-RT Film thickness measuring instrumentProduct Introduction
Filmetrics F10-RT Film thickness measuring instrumenttoVacuum coatingFor the design objectiveF10-RT The film thickness gauge can obtain reflection and transmission spectra with just a click of the mouse. Just simple operation. Then the user can proceed FWHM And conduct color analysis. The optional thickness and refractive index modules enable you to make the most of themFilmetrics F10-RT Film thickness measuring instrumentThe analytical ability. The measurement results can be exported and printed quickly.
Product features and advantages of Filmetrics F10-RT film thickness Measuring instrument
Synchronously measure the reflectance of the film/Penetration rate1sObtain the result internally;
The advantages of simple, fast and easy-to-use analysis;
The equipment is equipped with complete standard configurations to ensure its high reliability.
The measurement results can be exported and printed quickly.
The measurement principle of the Filmetrics F10-RT film thickness measuring instrument product:
When incident light passes through the interfaces of different substances, some of the light will be reflected. Due to the wave nature of light, the reflected light from multiple interfaces interferes with each other, causing the multi-wavelength spectrum of the reflected light to oscillate. From the oscillation frequency of the spectrum, the distance between different interfaces can be determined, and thus the thickness of the material can be obtained (the more oscillations, the greater the thickness). At the same time, other material properties such as refractive index and roughness can also be obtained.
Filmetrics F10-RT Product application of film thickness measuring instrument and film layer examples
Semiconductor film layer | Display technology | Consumer electronics | Parrylin |
Photoresist | OLED | Waterproof coating | Electronic products/Circuit board |
Dielectric layer | ITOandTCOs | Radio Frequency Identification | Magnetic material |
Gallium arsenide | Thick air box | Solar cell | Medical devices |
Micro-electromechanical system | PVDandCVD | Aluminum shell anode film | Silicone rubber |
Product parameters of Filmetrics F10-RT Thin Film Thickness Measuring Instrument
Wavelength range | 190nm-1700nm | Light source | Tungsten halogen lamp Deuterium lamp |
Thickness measurement range | 1 nm - 150 microns | Measurement accuracy | 0.01 nm |
Spot size | 6mm | Stability | 0.05 nm |
For more parameters, please contact us |
Measurement diagram of Filmetrics F10-RT thin Film thickness measuring instrument
